Secondary fluorescence correction for quantitative X-ray microanalysis integrated in a user-friendly framework
July 30, 2020
Yu Yuan (1), Hendrix Demers (2), Samantha Rudinsky (3), Nicolas Brodusch (1), Mathieu Gendron (4), Eric Yen (4), Sabrina Clusiau (4), Nicolas Piché (4), Raynald Gauvin (1)
Microscopy and Microanalysis, 26, Supplement S2, July 2020: 956-969. DOI: 10.1017/S1431927620014865
Abstract
In scanning electron microscopy (SEM) or electron probe microanalysis (EPMA), the Monte Carlo method is widely used for modeling electron and X-ray transport within specimens. For an accurate simulation, the calculation of secondary fluorescence is necessary, especially for specimens with complex structures.
How Our Software Was Used
Dragonfly was used to perform image segmentation, visualization, and analysis.
Author Affiliation
(1) McGill University, Montreal, Quebec, Canada.
(2) Centre d’excellence en électrification des transports et stockage d’énergie, Hydro-Québec, Varennes, Quebec, Canada.
(3) Steam Instruments, Montreal, Quebec, Canada.
(4) Object Research Systems, Montreal, Quebec, Canada.